CIRACI, S. Et Al. 1982. AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY , vol.21, no.2 , 402-404.

CIRACI, S., Ellialtıoğlu, S. Ş., & ERKOC, S., (1982). AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY , vol.21, no.2, 402-404.

CIRACI, S, Süleyman Şinasi Ellialtıoğlu, And S ERKOC. "AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS," JOURNAL OF VACUUM SCIENCE & TECHNOLOGY , vol.21, no.2, 402-404, 1982

CIRACI, S Et Al. "AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS." JOURNAL OF VACUUM SCIENCE & TECHNOLOGY , vol.21, no.2, pp.402-404, 1982

CIRACI, S. Ellialtıoğlu, S. Ş. And ERKOC, S. (1982) . "AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS." JOURNAL OF VACUUM SCIENCE & TECHNOLOGY , vol.21, no.2, pp.402-404.

@article{article, author={S CIRACI Et Al. }, title={AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS}, journal={JOURNAL OF VACUUM SCIENCE & TECHNOLOGY}, year=1982, pages={402-404} }