Quasistatic TEM characteristics of multilayer elliptical and cylindrical coplanar waveguides
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, vol.42, no.4, pp.317-322, 2004 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 42 Issue: 4
- Publication Date: 2004
- Doi Number: 10.1002/mop.20290
- Journal Name: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Page Numbers: pp.317-322
- Keywords: multilayer elliptical coplanar waveguides, multilayer cylindrical coplanar waveguides, conformal mapping, CAD-oriented formulas, STRIP LINES, ANALYTIC FORMULAS, PARAMETERS, ACCURATE
- TED University Affiliated: No
Abstract
Simple analytic CAD-oriented expressions are presented for calculating the quasistatic TEM parameters of multilayer elliptical coplanar waveguides (ME CPWs) and multilayer cylindrical coplanar waveguides (MC CPWs) by using the conformal trapping method. It is shown that the derived expressions are accurate and very simple for use in related applications. Comparisons have also been made between the results of this paper and those available in the literature. (C) 2004 Wiley Periodicals, Inc.