Scattered fields from axially symmetric reflectors (paraboloid, ellipsoid, hyperboloid, spheroid and plane) are calculated by high-frequency asymptotic techniques. For this purpose, the scattered fields from an axially symmetric reflector are expressed in terms of the reflector eccentricity. By using appropriate eccentricity values, the scattered fields from a reflector of any eccentricity can be obtained in a unified form. With the help of this approach, the effect of eccentricity on the focusing property of reflectors is studied. 7 refs.