AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS

CIRACI S., Ellialtıoğlu S. Ş., ERKOC S.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, vol.21, no.2, pp.402-404, 1982 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 21 Issue: 2
  • Publication Date: 1982
  • Doi Number: 10.1116/1.571664
  • Journal Name: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
  • Page Numbers: pp.402-404
  • TED University Affiliated: No