AN INVESTIGATION OF THE INTERFACE ELECTRONICS STRUCTURE OF SI-SIO2 JUNCTIONS

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CIRACI S., Ellialtıoğlu S. Ş., ERKOC S.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, vol.21, no.2, pp.402-404, 1982 (SCI-Expanded)

• Publication Type: Article / Article
• Volume: 21 Issue: 2
• Publication Date: 1982
• Doi Number: 10.1116/1.571664
• Journal Name: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
• Page Numbers: pp.402-404
• TED University Affiliated: No